A compact, module-changing probe that uses strain-gauge mechanisms for higher accuracy and longer life than kinematic touch-trigger probes. The TP200 was developed for tightly toleranced workpieces, and where access to features requires long or complex stylus arrangements.
High precision repeatability and 3D form measurement with long styli is achieved by employing a novel type of strain gauge structure to detect small displacements of the stylus tip. In standard probes, where a mechanical switch generates the touch signal, the force required at the stylus tip to trigger the probe varies with the probing direction, producing small form measurement errors sometimes called ‘lobing’. The TP200 overcomes this error by using electronic strain sensing to precisely detect the force produced by minute displacements of the stylus tip. The TP200 system incorporates a probe body and separate stylus modules, providing rapid stylus changing and probe overtravel capability, and is compatible with Renishaw’s probe heads and extension bars.
The TP200 system components are:
TP200 or TP200B probe body (the TP200B is a variant with increased vibration tolerance)
TP200 stylus module - choice of fixed overtravel forces: SF (standard force) or LF (low force)
PI 200-3 probe interface
SCR200 stylus change rack
There is also an EO module (extended overtravel) which has the same overtravel force as the SF but provides increased operating range and protection in the probe Z-axis.
The TP200 probe uses micro strain gauge transducers to deliver excellent repeatability and accurate 3D form measurement even with long styli. The sensor technology gives sub-micron repeatability and eliminates the lobing characteristics encountered with kinematic probes. The solid state ASIC electronics within the probe ensure reliable operation over millions of trigger points. The TP200B uses the same technology as TP200 but has been designed to have higher tolerance to vibration. This helps to overcome the problem of 'air' trigger generation which can arise from vibrations transmitted through the CMM or when using long styli with faster positioning speeds. Please note that we do not recommend the use of TP200B with the LF module or cranked / star styli.
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TP200 is recommended for tightly toleranced workpieces and high density point taking applications. It is also suited to features requiring long or complex stylus arrangements.
Fast, automatic stylus changing and stylus module life typically in excess of 10 million triggers, increase productivity, saving time and costs.
Strain-gauge technology offers excellent repeatability and precision 3D form measurement
Zero reseat errors
No lobing effect 6-way measuring capability
Allows optimisation of stylus arrangements, dealing with conflicting requirements such as feature access, surface finish and accuracy.
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Specification summary |
TP200 |
TP200B |
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Principal application |
DCC CMM where high accuracy is required. |
As TP200 but where 'air' trigger events occur. |
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Sense directions |
6-axis: ±X, ±Y, ±Z |
6-axis: ±X, ±Y, ±Z |
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Unidirectional repeatability (2σ µm) |
Trigger level 1: 0.40 µm (0.000016 in) Trigger level 2: 0.50 µm (0.00002 in) |
Trigger level 1: 0.40 µm (0.000016 in) Trigger level 2: 0.50 µm (0.00002 in) |
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XY (2D) form measurement deviation |
Trigger level 1: ±0.80 µm (0.000032 in) Trigger level 2: ±0.90 µm (0.000036 in) |
Trigger level 1: ±1 µm (0.00004 in) Trigger level 2: ±1.2 µm (0.000047 in) |
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XYZ (3D) form measurement deviation |
Trigger level 1: ±1 µm (0.00004 in) Trigger level 2: ±1.40 µm (0.000056 in) |
Trigger level 1: ±2.50 µm (0.0001 in) Trigger level 2: ±4 µm (0.00016 in) |
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Repeatability of stylus change |
With SCR200: ±0.50 µm (0.00002 in) max. Manual: ±1 µm (0.00004 in) max. |
With SCR200: ±0.50 µm (0.00002 in) max. Manual: ±1 µm (0.00004 in) max. |
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Trigger force (at stylus tip) |
XY plane (all modules): 0.02 N Z-axis (all modules): 0.07 N |
XY plane (all modules): 0.02 N Z-axis (all modules): 0.07 N |
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Overtravel force (@ 0.50 mm displacement) |
XY plane (SF / EO module): 0.2 N to 0.4 N XY plane (LF module): 0.1 N to 0.15 N Z-axis (SF / EO module): 4.90 N Z-axis (LF module): 1.60 N |
XY plane (SF / EO module): 0.2 N to 0.4 N XY plane (LF module): 0.1 N to 0.15 N Z-axis (SF / EO module): 4.90 N Z-axis (LF module): 1.60 N |
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Weight (probe sensor and module) |
22 g (0.78 oz) |
22 g (0.78 oz) |
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Maximum extension (if on a PH10 PLUS series head) |
300 mm (11.81 in) |
300 mm (11.81 in) |
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Maximum recommended stylus length (M2 styli range) |
SF / EO module: 50 mm (1.97 in) steel to 100 mm (3.94 in) GF LF module: 20 mm (0.79 in) steel to 50 mm (1.97 in) GF |
SF / EO module: 50 mm (1.97 in) steel to 100 mm (3.94 in) GF LF module: 20 mm (0.79 in) steel to 50 mm (1.97 in) GF |
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Mounting method |
M8 thread |
M8 thread |
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Suitable interface |
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Stylus module changing rack |
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Stylus range |
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Module |
SF (standard force) |
LF (low force) |
EO (extended overtravel) |
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Application |
General use. |
Small diameter stylus balls or where minimum force is essential. |
Extra overtravel to enable the CMM to stop safely from higher probing speeds. |
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Comments |
Styli up to 100 mm long and ball diameter > 1 mm. |
Balls less than 1 mm diameter. |
Same overtravel force as SF. Extra 8 mm of overtravel in probe Z-axis. |
Renishaw applies innovation to provide solutions to your problems
Renishaw is an established world leader in metrology, providing high performance, cost-effective solutions for measurement and increased productivity. A worldwide network of subsidiary companies and distributors provides exceptional service and support for its customers. Renishaw designs, develops and manufactures products which conform to ISO 9001 standards. Renishaw provides innovative and cost-effective solutions using the following products:
• Probe systems for inspection on CMMs (co-ordinate measuring machines).
• Systems for job set-up, toolsetting and inspection on machine tools.
• Scanning and digitising systems.
• Laser and automated ballbar systems for performance measurement and calibration of machines.
• Encoder systems for high accuracy position feedback.
• Spectroscopy systems for non-destructive material analysis in laboratory and process environments.
• Styli for inspection and tool setting probes.
• Customised solutions for your applications.
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