Sensor Probe Head Renishaw Module TP20 - SF Standard Force

Compact module changing touch-trigger probe, which allows the use of a range of stylus configurations and extensions to access features on complex parts TP20 with MCR20 and PI 200-3 The TP20 is a compact 5-way, or 6-way, kinematic touch-trigger probe system. The two-piece design, comprising probe body and detachable stylus module(s), connected using a highly repeatable magnetic kinematic coupling.

Sensor Probe Head Renishaw Module TP20 - SF Standard Force

TP20 probe system

The TP20 is a touch-trigger probe that gives its users the ability to change stylus configurations manually or automatically, without re-qualification. The TP20 is now widely accepted as the industry standard replacement for the TP2-5W probe, offering a range of new benefi ts. It can be easily retrofi tted to manual and DCC co-ordinate measuring machines (CMMs).

The range of modules

A range of seven, application specifi c, stylus modules is available: The low force module (LF) for high accuracy with short styli and delicate materials.

The standard force module (SF) is suitable for most applications.

The medium force module (MF) is suitable for vibration resistance when using longer styli.

The extended force module (EF) is suitable for very large stylus arrangements.

The 6-way module (6W) for measuring grooves and undercuts, has signifi cantly improved metrology performance over the TP2-6 way.

Two extension modules (EM1 and EM2) improve reach and offer better metrology performance than using equivalent length styli.

Probe extension modules

The EM1/EM2 extension modules increase probe reach, allowing the inspection of features with restricted access. The extensions available are 70 mm (EM1) or 95 mm (EM2). The standard trigger force module is integral to both EM1 and EM2. The use of an extension module gives improved metrology performance compared to using the equivalent length of stylus with a standard length module. The ability to change modules without re-qualifi cation and to automate the changing process (using the MCR20 rack), offers advantages over the use of existing probe extension bars, such as the Renishaw PEL1.

Fast, repeatable stylus changing

 The MCR20 module change rack The optional MCR20 module changing rack has the capability of storing up to six probe modules for automatic changing under measurement program control. Probe triggers are inhibited during module changing by a proximity switch system when using a TP20 probe body. When using a TP20 NI probe body the probe trigger must be inhibited through the software. Therefore, the MCR20 rack is passive and does not require an electrical connection to the CMM. The MCR20 is designed to securely hold the stored probe modules and to protect them from contaminants that may be present in the working environment.

The MSR1 module storage rack

The MSR1 can store up to 6 probe modules for manual stylus changing and safe keeping when not in use. Pre-qualifi ed stylus arrangements on probe modules can be selected and switched when needed.

Sensor Probe Head Renishaw Module TP20 - SF Standard Force

The TP20 system extends the availability of fast stylus changing to users of manual CMMs. For users of automated CMMs, software available from the machines’ suppliers facilitates automatic stylus changing in most TP2 or TP6 applications.

• Reduced cycle times achieved through fast stylus changing without re-qualifi cation.

• Optimised probe and stylus performance with seven specialised probe modules. • Easily retrofi tted to all Renishaw standard probe heads.

• Compatible with existing touch-trigger probe interfaces.

• Fitting to Renishaw’s autojoint probe heads with PAA adaptors/ extensions.

• Industry standard metrology performance. • Provides X and Y crash protection.

• Compatibility with Renishaw’s SP25M scanning probe system.

Sense directions

All modules except 6W

6W

±X, ±Y, +Z

±X, ±Y, ±Z

Suitable interface

PI 7-3, PI 200-3, UCC controllers

Pre-travel variation

LF

SF / EM1 / EM2

MF

EF

6W

±0.60 µm (± 0.000023 in)

±0.80 µm (± 0.000032 in)

±1.00 µm (± 0.000039 in)

±2.00 µm (± 0.000079 in)

±1.50 µm (±0.000058 in)

Unidirectional repeatability

LF / SF / EM1 / EM2

MF

EF

6W

±0.35 µm (± 0.000014 in)

±0.50 µm (± 0.000020 in)

±0.65 µm (± 0.000026 in)

±1.00 µm (± 0.0000395 in)

Repeatability of stylus changing

MCR20

Manual

±0.50 µm (± 0.000020 in)

±1.00 µm (± 0.000040 in)

Stylus range

M2

Mounting method

M8 thread

Module

Application

Trigger forces*

Stylus lengths

SF- Standard force

Suited to the majority of applications

XY: 0.08 N

Z: 0.75 N

Stylus: 10 mm

10 mm to 50 mm GF

LF- Low force

Low trigger forces applications - e.g. rubber seals

XY: 0.055 N

Z: 0.65 N

Stylus: 10 mm

10 mm to 30 mm

MF- Medium force

Where a higher trigger force than standard is required

XY: 0.1 N

Z: 1.9 N

Stylus: 25 mm

10 mm to 60 mm

EF- Extended force

Large stylus assemblies or where vibration causes spurious 'air' triggers

XY: 0.1 N

Z: 3.2N

Stylus: 50 mm

10 mm to 60 mm

6W- 6-way

Measurement in the –Z direction - e.g. undercuts

XY: 0.14 N

Z: 1.6N

Stylus: 10 mm

10 mm to 30 mm

EM1 STD- 50 mm extension

Majority of applications requiring a 50 mm extension

XY: 0.08 N

Z: 0.75 N

Stylus: 10 mm

10 mm to 50 mm

EM2 STD- 75 mm extension

Majority of applications requiring a 75 mm extension

XY: 0.08 N

Z: 0.75 N

Stylus: 10 mm

10 mm to 50 mm

Renishaw applies innovation to provide solutions to your problems

Renishaw is an established world leader in metrology, providing high performance, cost-effective solutions for measurement and increased productivity. A worldwide network of subsidiary companies and distributors provides exceptional service and support for its customers. Renishaw designs, develops and manufactures products which conform to ISO 9001 standards. Renishaw provides innovative and cost-effective solutions using the following products:

• Probe systems for inspection on CMMs (co-ordinate measuring machines).

• Systems for job set-up, toolsetting and inspection on machine tools.

• Scanning and digitising systems.

• Laser and automated ballbar systems for performance measurement and calibration of machines.

• Encoder systems for high accuracy position feedback.

• Spectroscopy systems for non-destructive material analysis in laboratory and process environments.

• Styli for inspection and tool setting probes.

• Customised solutions for your applications.

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